The materials characterization group at CIBA mainly works toward the development and application of ion-beam based analytical and microscopic techniques:
- Ion Beam Analysis and Nuclear Microscopy, including RBS, PIXE, ERDA, IBIC and related topics.
- Development of High Resolution Rutherford Backscattering (HRBS) for ultrathin film technology in the Angstrom range.
- Application of these techniques to materials science, microelectronics engineering and the life sciences.
- As an example, currently work on Channeling Contrast Microscopy and High Resolution RBS characterization of GeSn virtual substrates is ongoing.
The 45 degree beamline at CIBA, a general purpose nuclear microscope
Positioning of samples at the high resolution RBS chamber