Email: phyctk@nus.edu.sg
Office: S12-03-16
Tel: +65 6516 4149
Current Research
My current teaching research involves digital chroma key compositing to improve the student learning experience over the online medium. This process involves a teacher conducting a lesson in front of a green screen, which is digitally removed and replaced with the lesson content (e.g. PowerPoint slides), so that the teacher is projected in front of the content in a format known as the weatherman style composite video. This mimics face-to-face learning in a classroom setting for students attending lectures remotely over the online medium. Results from student surveys indicate that such an implementation significantly improved the clarity of the lecture, allowing the teacher to better capture their attention and making the lessons feel more engaging.
Selected Publications
- T.K. Chan. “Implementation of Green Screen/Chroma Key Technology During Online Lectures”. Asian Journal of the Scholarship of Teaching and Learning 11(2), 121 – 129 (2021)
- T. K. Chan. “Implementation and impact of authentic learning in a postgraduate applied physics course”. Asian Journal of the Scholarship of Teaching and Learning 10(2), 153 – 170 (2020)
- T.K. Chan, S.Y. Koh, V. Fang, A. Markwitz, T. Osipowicz, “Loss of implanted heavy elements during annealing of ultra-shallow ion-implanted silicon: the complete picture” Applied Surface Science 314, 322 – 330 (2014)
- S. Mathew, A. Annadi, T.K. Chan, T.C. Asmara, D. Zhan, X.R. Wang, S. Azimi, Z. Shen, A. Rusydi, Ariando, M.B.H. Breese and T. Venkatesan “Tuning the Interface Conductivity of LaAlO3 / SrTiO3 Using Ion Beams: Implications for Patterning” ACS Nano 7, 10572–10581 (2013)
- S. Mathew, K. Gopinadhan, T. K. Chan, X. J. Yu, D. Zhan, L. Cao, A. Rusydi, M. B. H. Breese,S. Dhar, Z. X. Shen, T. Venkatesan and John T. L. Thong “Magnetism in MoS2 induced by proton irradiation” Applied Physics Letters 101,102103 (2012)
- T.K. Chan, F. Fang, A. Markwitz and T. Osipowicz, “Solid phase epitaxy of ultra-shallow Sn implanted Si observed using high-resolution Rutherford backscattering spectrometry” Applied Physics Letters 101, 081602 (2012)